Presentation at Nanostructures: Physics and Technology

Presentations at the 15th International Symposyum Nanostructures: Physics and Technology (Zh. Alferov and L. Esaki, co-chairs, Proceedings 2007, pp. 118-119), June 26 (Novosibirsk, Russia)
Determination of the structural properties of multiple quantum dot ensembles based on a rigorous X-ray specular and diffuse scattering analysis and comparison with measurements
L. I. Goray, G. E. Cirlin, E. Alves, Yu. B. Samsonenko, A. A. Tonkikh, N. K. Polyakov
and V. A. Egorov
Multiple and multi-wave diffraction, absorption, and resonances influence significantly X-ray scattering from multiple quantum dots (QDs), and these effects are taken into account by known theories only approximately. The present report dwells on application of a rigorous theoretical analyses of X-ray reflection from In(Ga)As/GaAs QD ensembles to the investigation of their structural properties. The angle dependences of diffuse scattering exhibit very strong peaks near the angles corresponding to specular reflection from the QD facets (the so-called blaze condition for gratings). These peaks exist at nearly the same diffraction angles for QDs with the equal slope angle; their intensities, however, may differ by a few times for vertically correlated and non-correlated QDs.
The presentation is published in Ioffe Physico-Technical Institute, St. Petersburg [ISBN 5-93634-022-8]. Click here to download the full text.